• enEnglish
    • deDeutsch
    • itItaliano
    • frFrançais
    • pt-ptPortuguês
    • huMagyar
    • trTürkçe
ACCRETECH TOKYO SEIMITSU
ACCRETECH (Europe)
Menü
  • About ACCRETECH
    • What we stand for
    • Fairs & Shows
    • Careers
    • Close
  • Products
    • Semiconductor
      • Wafer Prober
      • Wafer Dicer
      • Grinder
      • CMP
      • product list
      • Close
    • Industrial metrology
      • Form Measuring Instruments
      • Surface Measuring Instruments
      • Inline Measuring Instruments
      • Product list
      • Close
    • Close
  • Applications
    • Semiconductor
      • Wafer Edge Grinding
      • CMP
      • Wafer Probing
      • Polish Grinding
      • High Rigid Grinding
      • Wafer Dicing
      • Close
    • Industrial metrology
      • Measure the form
      • Measure the roughness
      • Measure inline
      • Close
    • Close
  • Service
    • Semiconductor
    • Industrial metrology
    • Close
  • Contact & Support
    • Semiconductor
    • Industrial metrology
    • Close
    • Close
  • Search
  • Menu
You are here: Home / Legal notice

Legal notice

ACCRETECH (Europe) GmbH
Landsbergerstr. 396
81241 Munich, Germany
Tel.: +49 (0)89 546788 0
Fax: +49 (0)89 546788 10
E-Mail: info@accretech.de

Executives: Ryuichi Kimura, Hitoshi Yoshida, Wolfgang Bonatz
Court of registration: Magistrates’ Court Munich, HRB 108 910
VAT ID No. DE151305933

Person responsible for the content in accordance with Section 55 Paragraph 2 RStV (German Broadcasting Agreement):

Mr Wolfgang Bonatz
Landsbergerstr. 396
81241 Munich, Germany
Tel.: +49 (0)89 546788 0
Fax: +49 (0)89 546788 10

Source information for the images and graphics used:

Homepage
Images: Carl Zeiss AG*

Companies 
About ACCRETECH: borisyankov; iStockphoto
Reliability: Carl Zeiss AG*
Manufacturing in Munich: jian wan; iStockphoto
Sites: ymgerman; iStockphoto
News and Events: EduLeite; iStockphoto

Products & Solutions
Semiconductor Production Equipment: Krystian Nawrocki; gettyimages
Industrial metrology: Echo; gettyimages
Wafer Prober and Frame Prober: sspopov; shutterstock

Innovation & Technology 
Technological Benefits: Carl Zeiss AG*
Research & Development: Robert Churchill; iStockphoto

Support
Semiconductor/Metrology Service: Yuri; iStockphoto
Semiconductor/Metrology Contact Form: Nikada; iStockphoto
ACCRETECH Academy: Vereshchagin Dmitry; shutterstock
Installation and relocation: vaximilian; iStockphoto
Product information available for download: joanchang; shutterstock
Technical Advice: Echo; gettyimages
Maintenance and Calibration: Monty Rakusen; gettyimages
Software Support: tom_fewster; iStockphoto
ACCRETECH Academy: Yuri; iStockphoto

* with kind permission from Carl Zeiss AG

Concept and Design:

Anja Gerscher

Concept and Text:

Sibylle Maier

Web Development and Technical Implementation:

Ammersee Media – Online Marketing

We are here for you

+49 (0)89 546788-0

Contact form

How can we best contact you?

Copyright © 2018 - ACCRETECH (Europe) GmbH
  • Data protection
  • Legal notice
  • Terms and Conditions
  • Sitemap
Scroll to top

This Website uses Cookies more information...

Die Cookie-Einstellungen auf dieser Website sind auf "Cookies zulassen" eingestellt, um das beste Surferlebnis zu ermöglichen. Wenn du diese Website ohne Änderung der Cookie-Einstellungen verwendest oder auf "Akzeptieren" klickst, erklärst du sich damit einverstanden.

Schließen