SURFCOM 130
Compact and high-performing surface measuring instrument
Flexible, simple handling for the workshop and the quality measurement room
High precision straightness guide of the-X axis at 0.3 µm/ 50 mm
Free probe system with 800 µm measurement area, 12 nm resolution
3.5” Touch Screen colour display
High precision straightness guide of the-X axis at 0.3 µm/ 50 mm
Free probe system with 800 µm measurement area, 12 nm resolution
3.5” Touch Screen colour display
- All common international standards DIN EN ISO/CNOMO/ASME/JIS
- 7 language options for German, English, French, Spanish, Portuguese, Italian, Japanese
- Integrated thermal printer
- Memory slots for PC Cards and RSC 232 interface for safe transfer of the measurement data to the PC
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